ZEISS SmartSEM is a specialized software platform serving as the operating system for ZEISS scanning electron microscopes (SEM), field emission SEM (FE-SEM), and focused ion beam SEM (FIB-SEM). It provides comprehensive control over all microscope operational parameters, supporting both expert and novice users through customizable graphical user interfaces. SmartSEM enables advanced imaging, data acquisition, and analysis, with modular extensions for particle analysis, image browsing, and touchscreen operation. The software supports automation of routine tasks, repeatable workflows, and multi-user environments, with system administrators able to pre-configure parameters for consistent data acquisition. SmartSEM integrates with additional modules for 3D surface reconstruction, cross-platform specimen transfer, and industrial cleanliness analysis. The platform is designed for scalability, allowing users to extend functionality via licenses and modules as research or industrial needs evolve.

Key Features

Comprehensive Microscope Control Full access to all operational parameters for SEM, FE-SEM, and FIB-SEM.

• Advanced settings for experienced users.
• Concise GUI for occasional or novice users.

Modular Extensions Add-on modules for specialized analysis and workflow enhancement.

• SmartPI for particle size, shape, and elemental analysis.
• SmartBrowse for image navigation and contextual sample exploration.
• 3DSM for 3D surface reconstruction from 2D SEM data.

Automated and Repeatable Workflows Support for routine and industrial inspection tasks.

• Pre-configured parameters for recurring imaging routines.
• Automated data acquisition and reporting.

Touchscreen Operation SmartSEM Touch interface for intuitive, interactive control.

• Reduces training time and supports automated workflows.
• Multi-language support for global usability.

Multi-User and Access Control Role-based interfaces for system administrators, experts, and routine users.

• Calibration and parameter management by administrators.
• Access privileges tailored to user experience level.

Data Management and Integration Efficient handling and transfer of microscopy data.

• FTP image archiving and metadata management.
• Integration with light microscopes via Shuttle & Find.

Benefits

Enhanced Imaging and Analysis Unlocks advanced imaging capabilities and quantitative analysis.

• Supports challenging research and industrial applications.
• Enables 3D reconstruction and multi-modal data integration.

Scalable and Customizable Adaptable to evolving research and production needs.

• Extend functionality with modules and licenses.
• Suitable for both routine and complex workflows.

Efficient Training and Operation Intuitive interfaces for rapid onboarding and reduced errors.

• Touchscreen and simplified GUIs for novice users.
• Pre-configured workflows for repeatable results.

Multi-User Collaboration Supports collaborative environments and shared instrument usage.

• Role-based access and workflow management.
• Facilitates data sharing and project organization.