ZEISS SmartPI (Smart Particle Investigator) is an advanced software platform that automates the detection, analysis, and classification of particles using scanning electron microscopes (SEM) and energy-dispersive X-ray spectroscopy (EDS). It provides a turnkey solution for industrial cleanliness, metal, steel, and other material applications by integrating SEM control, image processing, and elemental analysis within a single application. SmartPI enables unattended, repeatable, and high-throughput particle analysis, generating industry-standard compliant reports (e.g., ISO 16232, VDA 19). The software features auto-calibration, self-diagnostics, and auto-recovery routines to ensure system stability and data accuracy. It supports both rapid and detailed particle classification modes, advanced morphological and chemical analysis, and can be integrated with ZEISS light microscope solutions for correlative workflows. SmartPI is designed for ease of use, requiring minimal operator intervention, and stores all recipes, configurations, and results in an auditable database for traceability and data export.

Key Features

Automated SEM and EDS Control Single application for full SEM imaging and EDS analysis.

• Controls both imaging and elemental analysis from one interface.
• Enables unattended, automated particle analysis.

Advanced Particle Detection and Classification Morphological and chemical analysis of particles.

• Measures size, shape, and other morphological features.
• Classifies particles by chemical composition using EDS.

Industry-Standard Reporting Compliant with cleanliness and quality standards.

• Generates reports according to ISO 16232 and VDA 19.
• Stores all data in an auditable database for traceability.

Auto-Calibration and Diagnostics Ensures accuracy and system stability.

• Performs self-diagnostics and auto-calibration before and during runs.
• Auto-recovery in case of interruptions (e.g., filament replacement).

Flexible Analysis Modes Supports both rapid and detailed workflows.

• Spot Mode for fast analysis; Feature Scan Mode for detailed classification.
• Advanced stop criteria for efficient, targeted analysis.

Correlative Workflows Integrates with ZEISS light microscope particle analysis.

• Enables multi-modal, correlative particle analysis.

Benefits

Increased Productivity and Efficiency Automates repetitive, high-volume particle analysis.

• Reduces manual intervention and operator time.
• Enables continuous, unattended operation.

Consistent, Repeatable Results Minimizes user bias and variability.

• Standardizes analysis across operators and laboratories.
• Ensures data integrity and traceability.

Comprehensive Particle Characterization Combines morphological and chemical data for robust classification.

• Supports process control, quality assurance, and root cause analysis.

Regulatory and Industry Compliance Meets international cleanliness and quality standards.

• Facilitates compliance with ISO 16232, VDA 19, and other standards.