Dragonfly 3D World ZEISS Edition is a comprehensive software platform for advanced 3D visualization, segmentation, and quantitative analysis of data from ZEISS X-ray, SEM, and FIB-SEM microscopes. The software integrates state-of-the-art volume rendering, image processing, and machine learning tools, enabling users to explore, segment, and quantify complex multi-scale datasets. It supports interactive navigation, multi-planar slicing, and professional 3D graphics for detailed structural analysis. Deep learning modules allow for AI-driven segmentation, while Python scripting and plugin support provide workflow customization and automation. The platform is designed for seamless integration with ZEISS systems, supporting a wide range of research and industrial applications that require high-quality 3D data interpretation.

Key Features

Advanced 3D Visualization High-quality rendering and interactive exploration of volumetric data.

• Multi-planar slicing, opacity adjustment, and depth of field controls.
• Multiple lights, material definitions, and improved tone mapping for realistic 3D renderings.

Segmentation and Quantitative Analysis Comprehensive tools for image segmentation and measurement.

• Manual, semi-automated, and AI-driven segmentation routines.
• Quantitative analysis of structures, including radiomics and texture extraction.

Deep Learning Integration AI-powered segmentation and analysis.

• Optional deep learning module powered by TensorFlow and Keras.
• Use pre-built or custom models for complex segmentation tasks.

Image Processing and Enhancement Broad suite of image processing functions.

• Edge detection, morphology, contrast adjustment, and texture analysis.
• Automated porosity and fiber segmentation for materials science.

Workflow Customization and Automation Flexible scripting and plugin support.

• Python scripting for automation and workflow customization.
• Plugin architecture for extensibility and integration with other tools.

Correlative and Multi-Modal Data Support Handles multi-scale, multi-microscope datasets.

• Import and analyze data from XRM, SEM, and FIB-SEM.
• Supports registration, resampling, and stitching of 3D datasets.

Benefits

Accelerated Research and Analysis Streamlines complex 3D data interpretation.

• Reduces manual effort with automated and AI-driven tools.
• Enables rapid, reproducible quantitative analysis.

High-Quality Visualization and Reporting Delivers publication-ready graphics and insights.

• Professional 3D graphics for presentations and reports.
• Customizable visualizations for different research needs.

Seamless Integration with ZEISS Systems Optimized for ZEISS microscopy workflows.

• Direct compatibility with ZEISS X-ray, SEM, and FIB-SEM instruments.
• Enhances the value of ZEISS imaging hardware.

Flexible and Extensible Platform Adapts to diverse research and industrial requirements.

• Scripting and plugin support for tailored workflows.
• Regular updates with new features and enhancements.