SMore Gauge (SMG) is a high-precision 2D and 3D metrology software designed to meet simple and complex measurement tasks across manufacturing and automation. It integrates a comprehensive set of machine vision algorithms—sub-pixel-level feature extraction, shape recognition, edge detection, template matching, and 3D probing—to deliver accurate dimensioning, profiling, and alignment results. A zero-code interface enables users to create sophisticated metrology applications through drag-and-drop components, lowering the technical barrier and accelerating deployment. The platform is flexible and scalable, supporting both standard inspection workflows and customized measurement tasks across diverse industrial environments.

In real-world applications, SMG has been used for precision injection molded parts inspections, covering more than 70 measurement items such as distance, angle, height, position, profile, flatness, and parallelism. It provides robust quality metrics including GRR ≤ 15%, repeatability ≤ 0.005 mm, and correlation ≤ 0.010 mm, ensuring reliable process control and traceability. By combining advanced vision tooling with a no-code architecture, SMG helps manufacturers reduce inspection cycle times, improve repeatability, and integrate measurement data into existing manufacturing IT stacks.

Features & Benefits

• Zero-code Drag-and-Drop Interface: Create metrology applications with simple drag-and-drop components, lowering technical barriers and speeding deployment.
• Comprehensive Machine Vision Toolset: Includes sub-pixel feature extraction, shape recognition, edge detection, template matching, and 3D probing for versatile measurement tasks.
• High-Precision, Reproducible Measurements: Delivers precise 2D/3D measurements with strict quality metrics.
• Flexible, Scalable Metrology Applications: Supports standard and customized measurement tasks across diverse industrial automation scenarios.
• Real-World Inspection Capabilities: Application cases include precision injection molded parts inspections with 70+ measurement items (distance, angle, height, position, profile, flatness, parallelism, etc.).