Si NIR Matrix

Si NIR Matrix is an FT‑NIR sensor module designed for integration into portable devices, embedded systems, and field-deployed tools. It delivers accurate, real-time material analysis of irregular, nonuniform samples with a larger sampling area and broad spectral coverage.

Features

• 10 mm measurement spot captures larger sample area for consistent results on uneven or heterogeneous materials
• Wide NIR spectral range (1,350–2,550 nm) enabling simultaneous detection of multiple material parameters
• Fast, non-destructive analysis—results generated in seconds without sample prep
• Built on MEMS FT‑NIR platform to deliver lab-grade accuracy in compact form
• Standard SPI interface for seamless integration with microcontrollers and embedded systems

Capabilities

• Reliable, real-time material composition analysis embedded directly into OEM products
• Consistent performance across non-uniform and textured materials thanks to large-area sampling
• Simultaneous multi-parameter measurement in one scan for efficient data gathering
• Non-invasive testing preserving sample integrity while delivering fast insights
• Field-level durability and stability via MEMS-based sensing core
• Easy integration into portable and embedded platforms using standard interfaces

Benefits

• Enables portable, on-site material analysis in rugged and variable conditions
• Improves data reliability on inconsistent samples through larger sampling area
• Speeds up product workflows with instant, non-destructive measurements
• Reduces development complexity by using compact, integrated sensing module
• Supports OEM customization and quick deployment via standardized interface
• Delivers laboratory-grade accuracy in embedded systems without bulky equipment